描述

Differential interference microscope,OL-Y200LED-X,OL-Y200,

This microscope is mainly used for industrial testing and metallographic analysis, mainly used to check the effective conduction of ACF after the blasting situation, according to the ergonomic design, to a great extent to reduce the fatigue of the operator.Its modular component design can freely combine system functions.It covers a variety of observation functions such as bright field, dark field, oblique lighting, polarized light, DIC differential interference and so on.

Specially designed for the LCD industry/TFT glass/COG conducting particle indentation, particle blasting inspection, but also for the realization of wafer or small size sample metallographic inspection.

1. Rich observation methods to meet your detection needs: Ming
Field observation, dark field observation, simple polarized light observation, DIC micro
Partial interference observation, etc.;
2. Strong halogen light source, 12V100W halogen lamp lighting
Ming, can choose LBD daylight filter, can be
The light is filtered to the color of natural daylight and the image background is soft
Bright white.According to the specific industrial testing needs, can choose
Choose another color filter to adjust the light spectrum
Section to get good image effects
3. Its differential interference effect is comparable to that of imported brands;
4. It is just like the three-way observation cylinder with a tilt of 30°, greatly improving the comfort of observation and the adaptability of operation;
5. Objective magnification is available in 5X10X20X;
6. The large-size platform design can be applied to the metallographic inspection of samples of various sizes;